Reliability growth: A survey

Microelectronics Reliability

Volumn 20, Issue 5, 1980, Pages 743-754

  Dhillon, Balbir S ^a  

^a UNIVERSITY OF OTTAWA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY - PRODUCTION CONTROL;

RELIABILITY GROWTH;

QUALITY ASSURANCE;

EID: 0019285325     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(80)90403-5     Document Type: Article

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