A Confidence Interval for the Barlow-Scheuer Reliability Growth Model

IEEE Transactions on Reliability

Volumn R-27, Issue 5, 1978, Pages 308-310

  Olsen, Dale E ^a  

^a NONE   (United States)

Author keywords

Barlow Scheuer growth model; Reliability estimators; Reliability growth modeling; s Confidence intervals

Indexed keywords

MATHEMATICAL MODELS; PROBABILITY; SYSTEMS ENGINEERING;

RELIABILITY GROWTH;

RELIABILITY THEORY;

EID: 0018106414     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1978.5220395     Document Type: Article

References (11)

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2. W.J. Corcoran, R.R. Read, “Comparison of some reliability growth estimation and prediction schemes”, UTC2140-ITR, United Technology Center, 1967 Jun.
3. A.J. Gross, M. Kamins, “Reliability assessment in the presence of reliability growth”, Proc. 1968 Annual Symp. Reliability, pp 405-414.
4. Willi K. Kraut, “Analytical techniques for cyclical equipment exhibiting reliability growth”, report NATFCOS-3 AD763341. Available from NITS; Springfield, Va. 22150, USA.
5. Nancy R. Mann, Frank E. Grubbs, “Approximately optimum confidence bounds for system reliability based on component test data”, Technometrics, vol 16, 1974 Aug, pp 335-347.
6. Nancy R. Mann, “Approximately optimum (randomized and non-randomized) confidence bounds on series—and parallel system reliability for systems with binomial subsystem data”, IEEE Trans. Reliability, vol R-23 1974 Dec, pp 296-304.
7. Clyde Meade, T. Cox, J. Lavery, “Reliability growth management in USAMC”, Proc. 1975 Annual Reliability & Maintainability Symp., pp 432-437.
8. D.E. Olsen, “Estimating reliability growth”, IEEE Trans. Reliability, vol R-26, 1977 Apr, pp 50-53.
9. Supplement: NAPS Document No. 02902; 19 pages in this Supplement. For current ordering information, see “Information for Readers & Authors” in a current issue. ASIS-NAPS; Microfiche Publications; POBox 3513, Grand Central Station; New York, NY 10017 USA.
10. R.R. Read, A remark on the Barlow-Scheuer reliability growth estimation scheme”, Technometrics, vol 13, 1971, pp 199-200.
11. Alan Winterbottom, “Lower confidence limits for series system reliability for binomial subsystem data”, J. American Statistical Association, vol 69, 1974 Sep, pp 782-788.