A Logarithmic Reliability-Growth Model for Single-Mission Systems

IEEE Transactions on Reliability

Volumn R-32, Issue 5, 1983, Pages 508-511

  Finkelstein, J M ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

Discrete measure of process size; Monte Carlo simulation; Nonhomogeneous Poisson process; Probability of mission success; Reliability growth; Single mission system

Indexed keywords

MATHEMATICAL STATISTICS - MONTE CARLO METHODS; RELIABILITY THEORY;

PROBABILITY OF MISSION SUCCESS; RELIABILITY GROWTH; SINGLE-MISSION SYSTEMS;

SYSTEMS ENGINEERING;

EID: 0020985395     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1983.5221743     Document Type: Article

References (7)

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3. J. M. Finkelstein, “Confidence bounds on the parameters of the Weibull process”, Technometrics, vol 18, 1976, pp 115-117.
4. L. Lee, S. K. Lee, “Some results on inference for the Weibull process”, Technometrics, vol 20, 1978, pp 41-45.
5. J. M. Finkelstein, “Starting and limiting values for reliability growth”, IEEE Trans. Reliability, vol R-28, 1979, pp 111-114.
6. L. J. Bain, M. Englehardt, “Inferences on the parameters and current system reliability for a time truncated Weibull process”, Technometrics, vol 22, 1980, pp 421-426.
7. MIL-STD-189, Reliability Growth Management, available from the Naval Publications and Forms Center; 5801 Tabor Ave.; Philadelphia, PA 19120 USA.