Asymptotic properties of estimators in a binomial reliability growth model and its continuous-time analog

Journal of Statistical Planning and Inference

Volumn 29, Issue 1-2, 1991, Pages 43-53

  Bhattacharyya, Gouri K ^a   Ghosh, Jayanta K ^b  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b INDIAN STATISTICAL INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44049110610     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/0378-3758(92)90120-H     Document Type: Article

References (12)

1. Inferences on the parameters and current system reliability for a time truncated Weibull process
2. Properties of continuous analog estimators for a discrete reliability growth model
3. Estimation of parameters in a discrete reliability growth model and some non-standard asymptotics
4. Reliability analysis for complex, repairable systems
5. Confidence interval procedures for the Weibull process with applications to reliability growth
6. AMSAA discrete reliability growth model
7. Learning curve approach to reliability monitoring
8. A logarithmic reliability growth model for single-mission systems
9. Some results on inference for the Weibull process
10. Estimating the intensity function of a Weibull process at the current time Failure truncated cas
11. Maximum likelihood estimation in a class of nonregular cases