Plastic packaging is highly reliable

IEEE Transactions on Reliability

Volumn 45, Issue 2, 1996, Pages 184-193

  Sinnadurai, Nihal ^a  

^a Electronics Technology   (United Kingdom)

Author keywords

Accelerated testing; Autoclave; Environment; Harsh; HAST; Hermetic; Non saturating; Packaging; Plastic; Tropical

Indexed keywords

DIGITAL DEVICES; ENCAPSULATION; ENVIRONMENTAL TESTING; INTEGRATED CIRCUIT TESTING; MICROELECTRONICS; MICROPROCESSOR CHIPS; MULTICHIP MODULES; PLASTICS APPLICATIONS; PRINTED CIRCUIT BOARDS; RELIABILITY; SEMICONDUCTOR DEVICES; STANDARDS;

ACCELERATED TESTING; DIGITAL SWITCHES; HIGHLY ACCELERATED STRESS TEST; NON SATURATING AUTOCLAVE TEST; PLASTIC ENCAPSULATION; PLASTIC PACKAGING;

ELECTRONICS PACKAGING;

EID: 0030167875     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.510800     Document Type: Article

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