COMPREHENSIVE MODEL FOR HUMIDITY TESTING CORRELATION.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1986, Pages 44-50

  Peck, D Stewart ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING - ENCAPSULATION; MATHEMATICAL STATISTICS;

HUMIDITY TESTING;

SEMICONDUCTOR DEVICES;

EID: 0022605808     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1986.362110     Document Type: Conference Paper

References (22)