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Volumn 13, Issue 1, 1974, Pages 23-27
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The accelerated ageing of plastic encapsulated semiconductor devices in environments containing a high vapour pressure of water
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTOR DEVICE TESTING;
SEMICONDUCTOR DEVICES;
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EID: 0016028194
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/0026-2714(74)90207-8 Document Type: Article |
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Times cited : (33)
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References (3)
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