An evaluation of plastic coatings for high reliability microcircuits

Microelectronics Journal

Volumn 12, Issue 6, 1981, Pages 30-38

  Sinnadurai, Nihal ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ENCAPSULATION;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0019633691     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(81)80361-8     Document Type: Article

References (9)

1. Some Problems and Possible Solutions for Hybrid Microcircuit Reliability
2. The Accelerated Testing of Plastic Encapsulated Semiconductor Components
3. The Influence of Plastic Encapsulation and Passivation Layers on the Corrosion of Thin Aluminium Subjected to Humidity Stress
4. The Accelerated Ageing of Semiconductor Devices in Environments containing a High Vapour Pressure of Water
5. Mechanisms and Modes of Failure in Silicon Planar Semiconductor Devices
6. Thin Silicon Membranes—Their Permeation Properties and Some Applications
7. New Acceleration Factors for Temperature, Humidity Bias Testing