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Volumn 44, Issue 1, 1996, Pages 114-121

Small-signal characterization of microwave and millimeter-wave hemt's based on a physical model

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; EQUIVALENT CIRCUITS; MICROWAVE DEVICES; MILLIMETER WAVE DEVICES; PERFORMANCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; TIME DOMAIN ANALYSIS;

EID: 0029733141     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.481393     Document Type: Article
Times cited : (15)

References (13)
  • 1
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    • IEEE Trans. Electron Device
    • Snowden, C.M.1    Pantoja, R.R.2
  • 2
    • 0026888040 scopus 로고    scopus 로고
    • "GaAs MESFF.T physical model for process-oriented design,"
    • vol. 40, no. 7, pp. 1401-1409, July 1992.
    • "GaAs MESFF.T physical model for process-oriented design," IEEE Trans. Microwave Theory and Tech., vol. 40, no. 7, pp. 1401-1409, July 1992.
    • IEEE Trans. Microwave Theory and Tech.
  • 3
    • 0024878774 scopus 로고    scopus 로고
    • "A Large-signal physical MESFET model for computer-aided design and its applications,"
    • vol. 37, no. 12, pp. 2039-2045, Dec. 1989.
    • R. R. Pantoja, M. J. Howes, R. R. Richardson, and C. M. Snowden, "A Large-signal physical MESFET model for computer-aided design and its applications," IEEE Trans. Microwave Theory Tech., vol. 37, no. 12, pp. 2039-2045, Dec. 1989.
    • IEEE Trans. Microwave Theory Tech.
    • Pantoja, R.R.1    Howes, M.J.2    Richardson, R.R.3    Snowden, C.M.4
  • 4
    • 33747315461 scopus 로고    scopus 로고
    • "Large-signal modeling of millimeterwave HEMT's," in fror. 24ih
    • 1994, pp. 1325-1330.
    • R. Singh and C. M. Snowden, "Large-signal modeling of millimeterwave HEMT's," in fror. 24ih European Microwave Conf., Cannes, 1994, pp. 1325-1330.
    • European Microwave Conf., Cannes
    • Singh, R.1    Snowden, C.M.2
  • 5
    • 0024629334 scopus 로고    scopus 로고
    • "Physical modeling of GaAs MESFET's in an integrated CAD environment: From device technology to microwave circuit performance,"
    • vol. 37, no. 3, pp. 457-468, Mar. 1989.
    • G. Ghione, C. U. Naldi, and F. Filicori, "Physical modeling of GaAs MESFET's in an integrated CAD environment: from device technology to microwave circuit performance," IEEE Trans. Microwave Theory Tech., vol. 37, no. 3, pp. 457-468, Mar. 1989.
    • IEEE Trans. Microwave Theory Tech.
    • Ghione, G.1    Naldi, C.U.2    Filicori, F.3
  • 6
    • 0026884998 scopus 로고    scopus 로고
    • "Physics-based electron device modeling and computer-aided MMIC design,"
    • vol. 40, no. 7, pp. 1333-1352, July 1992.
    • F. Filicori, G. Ghione, and C. U. Naldi, "Physics-based electron device modeling and computer-aided MMIC design," IEEE Trans. Microwave Theory Tech., vol. 40, no. 7, pp. 1333-1352, July 1992.
    • IEEE Trans. Microwave Theory Tech.
    • Filicori, F.1    Ghione, G.2    Naldi, C.U.3
  • 8
    • 0026891896 scopus 로고    scopus 로고
    • "A technique for modeling S-parameters tor HEMT structures as a function of gate bias,"
    • vol. 40, no. 7, pp. 2336-2344, July 1992.
    • S. J. Mahon, D. J. Skellern, and F. Green, "A technique for modeling S-parameters tor HEMT structures as a function of gate bias," IEEE Trans. Microwave Theory Tech., vol. 40, no. 7, pp. 2336-2344, July 1992.
    • IEEE Trans. Microwave Theory Tech.
    • Mahon, S.J.1    Skellern, D.J.2    Green, F.3
  • 9
    • 33747251951 scopus 로고    scopus 로고
    • "A quasi-two-dimensional HEMT model for DC & microwave simulation incorporating deep level effects," Submitted for publication iii
    • R. Singh and C. M. Snowden, "A quasi-two-dimensional HEMT model for DC & microwave simulation incorporating deep level effects," Submitted for publication iii IEEE Trans Election Devices.
    • IEEE Trans Election Devices.
    • Singh, R.1    Snowden, C.M.2
  • 10
    • 33747218484 scopus 로고    scopus 로고
    • "A self-consistent charge-control model for HEMT's incorporating deep level effects,"
    • Leeds, 1993, pp. 60-64.
    • "A self-consistent charge-control model for HEMT's incorporating deep level effects," in Proc. Int. Workshop on Computational Electronics, Leeds, 1993, pp. 60-64.
    • Proc. Int. Workshop on Computational Electronics
  • 11
    • 0019606256 scopus 로고    scopus 로고
    • "Power-limiting breakdown effects in GaAs MESFET's,"
    • vol. 28, no. 8, pp. 962-970, Aug. 1981.
    • W. R. Frensley, "Power-limiting breakdown effects in GaAs MESFET's," IEEE Trans. Electron Devices, vol. 28, no. 8, pp. 962-970, Aug. 1981.
    • IEEE Trans. Electron Devices
    • Frensley, W.R.1
  • 12
    • 0020706514 scopus 로고    scopus 로고
    • "Theoretical analysis of the DC avalanche breakdown in GaAs MESFET's,"
    • vol. 30, no. 2, pp. 154-159, Feb. 1983.
    • R. Wroblewski, G. Salmer, and Y. Crusnier, "Theoretical analysis of the DC avalanche breakdown in GaAs MESFET's," IEEE Tram. Electron Devices, vol. 30, no. 2, pp. 154-159, Feb. 1983.
    • IEEE Tram. Electron Devices
    • Wroblewski, R.1    Salmer, G.2    Crusnier, Y.3
  • 13
    • 0025465290 scopus 로고    scopus 로고
    • "Broad-band determination of the FET smallsignal equivalent circuit,"
    • vol. 38, no. 7, pp. 891-895, July 1990.
    • M. Berroth and R. Bosch, "Broad-band determination of the FET smallsignal equivalent circuit," IEEE Trans. Microwave Theory Tech., vol. 38, no. 7, pp. 891-895, July 1990.
    • IEEE Trans. Microwave Theory Tech.
    • Berroth, M.1    Bosch, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.