Theoretical Analysis of the DC Avalanche Breakdown in GaAs MESFET's

IEEE Transactions on Electron Devices

Volumn 30, Issue 2, 1983, Pages 154-159

  Wroblewski, Romuald ^a   Salmer, Georges ^a   Crosnier, Yves ^a  

^a UNIV LILLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

EID: 0020706514     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1983.21089     Document Type: Article

References (18)

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