An EFTEM and conical dark field investigation of co-sputtered CoPt+yttria stabilized zirconia thin films

Micron

Volumn 29, Issue 1, 1998, Pages 33-41

  Ristau, R A ^a   Hofer, F ^b   Barmak, K ^a   Coffey, K R ^c   Howard, J K ^d  

^a Lehigh University   (United States)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^c SEAGATE TECHNOLOGY   (United States)

^d IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032007470     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(97)00065-6     Document Type: Article

References (21)

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