Friction, scratching/wear, indentation, and lubrication using scanning probe microscopy

Modern Tribology Handbook: Volume One: Principles of Tribology

Volumn , Issue , 2000, Pages 667-716

  Bhushan, Bharat ^a  

^a Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003238814     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter

References (56)

1. Bhushan, B. (1995), Micro/Nanotribology and its applications to magnetic storage devices and MEMS, Tribol. Int., 28, 85-95.
2. Bhushan, B. (1996), Tribology and Mechanics of Magnetic Storage Devices, 2nd ed., Springer-Verlag, New York.
3. Bhushan, B. (1997), Micro/Nanotribology and Its Applications, Vol. E330, Kluwer Academic Pub., Dordrecht, Netherlands.
4. Bhushan, B. (1998a), Tribology Issues and Opportunities in MEMS, Kluwer Academic Pub., Dordrecht, Netherlands.
5. Bhushan, B. (1998b), Micro/nanotribology using atomic force/friction force microscopy: state of the art, Proc. Inst. Mech. Engrs. Part J: J. Eng. Tribol., 212, 1-18.
6. Bhushan, B. (1999a), Handbook of Micro/Nanotribology, 2nd ed., CRC Press, Boca Raton, FL.
7. Bhushan, B. (1999b), Nanoscale tribophysics and tribomechanics, Wear, 225-229, 465-492.
8. Bhushan, B. (1999c), Wear and mechanical characterisation on micro- to picoscales using AFM, Int. Mat. Rev., 44, 105-117.
9. Bhushan, B. (1999d), Principles and Applications of Tribology, John Wiley & Sons, New York.
10. Bhushan, B. and Blackman, G.S. (1991), Atomic force microscopy of magnetic rigid disks and sliders and its applications to tribology, ASME J. Tribol., 113, 452-458.
11. Bhushan, B. and Dandavate, C. (2000), Thin-film friction and adhesion studies using atomic force microscopy J. Appl. Phys., 87, 1201-1210.
12. Bhushan, B. and Goldade, A.V. (2000a), Measurements and analysis of surface potential change during wear of single crystal silicon (100) at ultralow loads using Kelvin probe microscopy, Appl. Surf. Sci., 157, 373-381.
13. Bhushan, B. and Goldade, A.V. (2000b), Kelvin probe microscopy measurements of surface potential change under wear at low loads, Wear, 244, 104-117.
14. Bhushan, B. and Koinkar, V.N. (1994a), Tribological studies of silicon for magnetic recording applications, J. Appl. Phys., 75, 5741-5746.
15. Bhushan, B. and Koinkar V.N. (1994b), Nanoindentation hardness measurements using atomic force microscopy, Appl. Phys. Lett., 64, 1653-1655.
16. Bhushan, B. and Kulkarni, A.V. (1996), Effect of normal load on microscale friction measurements, Thin Solid Films, 278, 49-56; 293, 333.
17. Bhushan, B. and Ruan, J. (1994), Atomic-scale friction measurements using friction force microscopy: part II — application to magnetic media, ASME J. Tribol., 116, 389-396.
18. Bhushan, B. and Sundararajan, S. (1998), Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy, Acta Mater., 46, 3793-3804.
19. Bhushan, B., Koinkar, V.N., and Ruan, J. (1994), Microtribology of magnetic media, Proc. Inst. Mech. Eng., Part J: J. Eng. Tribol., 208, 17-29.
20. Bhushan, B., Israelachvili, J.N., and Landman, U. (1995a), Nanotribology: friction, wear and lubrication at the atomic scale, Nature, 374, 607-616.
21. Bhushan, B., Kulkarni, A.V., Koinkar, V.N., Boehm, M., Odoni, L., Martelet, C., and Belin, M. (1995b), Microtribological characterization of self-assembled and Langmuir–Blodgett monolayers by atomic and friction force microscopy, Langmuir, 11, 3189-3198.
22. Bhushan, B., Kulkarni, A.V., Bonin, W., and Wyrobek, J.T. (1996), Nano/picoindentation measurement using a capacitance transducer system in atomic force microscopy, Philos. Mag., 74, 1117-1128.
23. Binnig, G., Quate, C.F., and Gerber, Ch. (1986), Atomic force microscopy, Phys. Rev. Lett., 56, 930-933.
24. Binnig, G., Gerber, Ch., Stoll, E., Albrecht, T.R., and Quate, C.F. (1987), Atomic resolution with atomic force microscope, Europhys. Lett., 3, 1281-1286.
25. Bowden, F. P. and Tabor, D. (1950), The Friction and Lubrication of Solids, Part 1, Clarendon Press, Oxford, U.K.
26. DeVecchio, D. and Bhushan, B. (1997), Localized surface elasticity measurements using an atomic force microscope, Rev. Sci. Instrum., 68, 4498-4505.
27. DeVecchio, D. and Bhushan, B. (1998), Use of a nanoscale Kelvin probe for detecting wear precursors, Rev. Sci. Instrum., 69, 3618-3624.
28. Frisbie, C.D., Rozsnyai, L.F., Noy, A., Wrighton M.S., and Lieber, C.M. (1994), Functional group imaging by chemical force microscopy, Science, 265, 2071-2074.
29. Guntherodt, H.J., Anselmetti, D., and Meyer, E. (1995), Forces in Scanning Probe Methods, Vol. E286, Kluwer Academic Pub., Dordrecht, Netherlands.
30. Koinkar, V.N. and Bhushan, B. (1996a), Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks, J. Appl. Phys., 79, 8071-8075.
31. Koinkar, V.N. and Bhushan, B. (1996b), Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy, J. Vac. Sci. Technol. A, 14, 2378-2391.
32. 3-TiC, polycrystalline and singlecrystal Mn–Zn ferrite and SiC head slider materials, Wear, 202, 110-122.
33. Koinkar, V.N. and Bhushan, B. (1997a), Microtribological properties of hard amorphous carbon protective coatings for thin film magnetic disks and heads, Proc. Inst. Mech. Eng. Part J: J. Eng. Tribol., 211, 365-372.
34. Koinkar, V.N. and Bhushan, B. (1997b), Effect of scan size and surface roughness on microscale friction measurements, J. Appl. Phys., 81, 2472-2479.
35. Koinkar, V.N. and Bhushan, B. (1997c), Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy, J. Mater. Res., 12, 3219-3224.
36. Kulkarni, A.V. and Bhushan, B. (1996a), Nanoscale mechanical property measurements using modified atomic force microscopy, Thin Solid Films, 290-291, 206-210.
37. Kulkarni, A.V. and Bhushan, B. (1996b), Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy, Materials Letters, 29, 221-227.
38. Kulkarni, A.V. and Bhushan, B. (1997), Nanoindentation measurement of amorphous carbon coatings, J. Mater. Res., 12, 2707-2714.
39. Li, W.B., Henshall, J.L., Hooper, R.M., and Easterling, K.E. (1991), The mechanism of indentation creep, Acta Metall. Mater., 39, 3099-3110.
40. Maivald, P., Butt, H.J., Gould, S.A.C., Prater, C.B., Drake, B., Gurley, J.A., Elings, V.B., and Hansma, P.K. (1991), Using force modulation to image surface elasticities with the atomic force microscope, Nanotechnology, 2, 103-106.
41. Makinson, K.R. (1948), On the cause of the frictional difference of the wool fiber, Trans. Faraday Soc., 44, 279-282.
42. Mate, C.M., McClelland, G.M., Erlandsson R., and Chiang, S. (1987), Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett., 59, 1942-1945.
43. Meyer, E., Overney, R., Luthi, R., Brodbeck, D., Howald, L., Frommer, J., Guntherodt, H.J., Wolter, O., Fujihira, M., Takano, T., and Gotoh, Y. (1992), Friction force microscopy of mixed Langmuir– Blodgett films, Thin Solid Films, 220, 132-137.
44. Persson, B.N.J. and Tosatti, E. (1996), Physics of Sliding Friction, Vol. E311, Kluwer Academic Pub., Dordrecht, Netherlands.
45. Ruan, J. and Bhushan, B. (1993), Nanoindentation studies of fullerene films using atomic force microscopy, J. Mater. Res., 8, 3019-3022.
46. Ruan, J. and Bhushan, B. (1994a), Atomic-scale friction measurements using friction force microscopy: part I — general principles and new measurement techniques, ASME J. Tribol., 116, 378-388.
47. Ruan, J. and Bhushan, B. (1994b), Atomic-scale and microscale friction of graphite and diamond using friction force microscopy, J. Appl. Phys., 76, 5022-5035.
48. Ruan, J. and Bhushan, B. (1994c), Frictional behavior of highly oriented pyrolytic graphite, J. Appl. Phys., 76, 8117-8120.
49. Scherer, V., Bhushan, B., Rabe, U., and Arnold, W. (1997), Local elasticity and lubrication measurements using atomic force and friction force microscopy at ultrasonic frequencies, IEEE Trans. Magn., 33, 4077-4079.
50. Scherer, V., Arnold W., and Bhushan, B. (1998), Active friction control using ultrasonic vibration, in Tribology Issues and Opportunities in MEMS, Bhushan, B. (Ed.), Kluwer Academic Pub., Dordrecht, Netherlands, 463-469.
51. Scherer, V., Arnold, W., and Bhushan, B. (1999), Lateral force microscopy using acoustic friction force microscopy, Surface and Interface Anal., 27, 578-587.
52. Schwarz, U.D., Zwoerner, O., Koester, P., and Wiesendanger, R. (1997), Friction force spectroscopy in the low-load regime with well-defined tips, in Micro/Nanotribology and Its Applications, Bhushan, B. (Ed.), Kluwer Academic, Dordrecht, Netherlands, 233-238.
53. Singer, I.L. and Pollock, H.M. (1992), Fundamentals of Friction: Macroscopic and Microscopic Processes, Vol. E220, Kluwer Academic Pub., Dordrecht, Netherlands.
54. Sundararajan, S. and Bhushan, B. (2000a), Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultra-thin hard amorphous carbon coatings, J. Mater. Res., in press.
55. Sundararajan, S. and Bhushan, B. (2000b), Topography-induced contributions to friction forces measured using an atomic force/friction force microscope, J. Appl. Phys., 88, 4825-4831.
56. Zhao, X. and Bhushan, B. (1998), Material removal mechanism of single-crystal silicon on nanoscale and at ultralow loads, Wear, 223, 66-78.