Kelvin probe microscopy measurements of surface potential change under wear at low loads

Wear

Volumn 244, Issue 1-2, 2000, Pages 104-117

  Bhushan, B ^a   Goldade, A V ^a  

^a Ohio State University   (United States)

Author keywords

Atomic force microscopy; Kelvin probe microscopy; Scratching; Surface potential; Wear

Indexed keywords

ALUMINA; ALUMINUM; CHEMICAL ANALYSIS; FLUORINE CONTAINING POLYMERS; GOLD; LUBRICANTS; LUBRICATION; MICROSCOPIC EXAMINATION; POLYETHERS; SINGLE CRYSTALS; SURFACE STRUCTURE; WEAR OF MATERIALS;

KELVIN PROBE MICROSCOPY; PERFLUOROPOLYETHER; SURFACE POTENTIAL;

SILICON WAFERS;

MICROSCOPY; SCRATCHING; WEAR DETECTION;

EID: 0034281625     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(00)00450-6     Document Type: Article

References (27)

1. Micro Kelvin probe for local work-function measurements
2. Scanning tunneling microscopy
3. High-resolution capacitance measurement and potentiometry by force microscopy
4. High resolution atomic force microscopy potentiometry
5. Kelvin probe force microscopy
6. Surface potential mapping: A qualitative material contrast in SPM
7. Kelvin probe measurements of wear of a magnetic hard disk
8. Surface potential and magnetic recording media tribology
9. Application of the contact potential difference technique for on-line rubbing surface monitoring
10. Use of a nanoscale Kelvin probe for detecting wear precursors
11. Macroscale and microscale tribological studies of molecularly thick boundary layers of perfluoropolyether lubricants for magnetic thin-film rigid disks
12. Resolution and contrast in Kelvin probe force microscopy
13. Scanning Maxwell stress microscope for nanometre-scale surface electrostatic imaging of thin films
14. Influence of water vapor on nanotribology studied by friction force microscopy
15. Nanoindentation hardness measurements using atomic force microscopy
16. The effect of strain on the fermi surfaces
17. Effect of contact deformation upon surface electron work function