Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy

Materials Letters

Volumn 29, Issue 4-6, 1996, Pages 221-227

  Kulkarni, Ashok V ^a   Bhushan, Bharat ^a  

^a Ohio State University   (United States)

Author keywords

Atomic force microscopy; Indentation size effects; Mechanical property measurements; Nanoindentation; Strain rate effects

Indexed keywords

ATOMIC FORCE MICROSCOPY; CREEP; HARDNESS; HYSTERESIS; SINGLE CRYSTALS; STRAIN RATE;

BERKOVICH INDENTER; LOAD DISPLACEMENT MEASUREMENTS; NANO/PICOINDENTATION; STRAIN RATE SENSITIVITY; SUBNANOMETER INDENTATION DEPTH SENSITIVITY;

ALUMINUM;

EID: 0030380920     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(96)00160-7     Document Type: Article

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