-
1
-
-
34848919386
-
-
Lett., 1982,49,57-61.
-
Binnig, G., Rohrer, H., Gerber, Ch. and Weibe], E. Surface studies by scanning tunnelling microscopy. Phys. Rev. Lett., 1982,49,57-61.
-
Rohrer, H., Gerber, Ch. and Weibe, E. Surface Studies by Scanning Tunnelling Microscopy. Phys. Rev.
-
-
Binnig, G.1
-
2
-
-
0012618901
-
-
Lett., 1986, 56, 930-933.
-
Binnig, G., Quate, C. F. and Gerber, Ch. Atomic force microscopy. Phys. Rev. Lett., 1986, 56, 930-933.
-
Quate, C. F. and Gerber, Ch. Atomic Force Microscopy. Phys. Rev.
-
-
Binnig, G.1
-
3
-
-
0023366049
-
-
Lett., 1987,3, 1281-1286.
-
Binnig, G., Gerber, Ch., Stoll, E., Albrecht, T. R. and Quate, C. F. Atomic resolution with atomic force microscope. Ewophys. Lett., 1987,3, 1281-1286.
-
Gerber, Ch., Stoll, E., Albrecht, T. R. and Quate, C. F. Atomic Resolution with Atomic Force Microscope. Ewophys.
-
-
Binnig, G.1
-
6
-
-
0029292717
-
-
Nature, 1995,374,607-616.
-
Bhushan, B., Israclaclivili, J. N. and Landman, U. Nanotribology: friction, wear and lubrication at the atomic scale. Nature, 1995,374,607-616.
-
Israclaclivili, J. N. and Landman, U. Nanotribology: Friction, Wear and Lubrication at the Atomic Scale.
-
-
Bhushan, B.1
-
7
-
-
85034183227
-
-
Netherlands.
-
Bhushan, B. Micro/'nanotribology and Its Applications, NATO ASI Series E: Applied Sciences, Vol. 330, 1997, pp. 169-191 (Kluwer Academic, Dordrecht, Netherlands).
-
Micro/'nanotribology and Its Applications, NATO ASI Series E: Applied Sciences, Vol. 330, 1997, Pp. 169-191 Kluwer Academic, Dordrecht
-
-
Bhushan, B.1
-
11
-
-
0030282664
-
-
A, 1997, 57, 91-102.
-
Bhushan, B. and Koinkar, V. N. Microtribological studies of doped single-crystal silicon and polysilicon films for MEMS devices. Sensors and Actuators A, 1997, 57, 91-102.
-
And Koinkar, V. N. Microtribological Studies of Doped Single-crystal Silicon and Polysilicon Films for MEMS Devices. Sensors and Actuators
-
-
Bhushan, B.1
-
12
-
-
0030869870
-
-
Res., 1997,12, 54-63.
-
Bhushan, B. and Li, X. Micromechanical and tribological characterization of doped single-crystal silicon and polysilicon films for microclectromechanical systems devices. J. Mater. Res., 1997,12, 54-63.
-
And Li, X. Micromechanical and Tribological Characterization of Doped Single-crystal Silicon and Polysilicon Films for Microclectromechanical Systems Devices. J. Mater.
-
-
Bhushan, B.1
-
14
-
-
85034189333
-
-
Florida.
-
Bhushan, B. and Gupta, B. K. Handbook of Tribology: Materials, Coatings and Surface Treatments, 1991 (McGrawHill, New York); 1997 (Krieger, Malabar, Florida).
-
And Gupta, B. K. Handbook of Tribology: Materials, Coatings and Surface Treatments, 1991 (McGrawHill, New York); 1997 Krieger, Malabar
-
-
Bhushan, B.1
-
16
-
-
0027947140
-
-
Tribology, 1994,116,378-388.
-
Ruan, J. and Bhushan, B. Atomic-scale friction measurements using friction force microscopy: part I-general principles and new measurement techniques. Trans. ASME, J. Tribology, 1994,116,378-388.
-
And Bhushan, B. Atomic-scale Friction Measurements Using Friction Force Microscopy: Part I-general Principles and New Measurement Techniques. Trans. ASME, J.
-
-
Ruan, J.1
-
17
-
-
0030293526
-
-
Mag., 1996, 74,1117-1128.
-
Bhushan, B., Kulkarni, A. V., Bonin, W. and Wyrobek, J. T. Nano/picoindentation measurement using a capacitive transducer system in atomic force microscopy. Phil. Mag., 1996, 74,1117-1128.
-
Kulkarni, A. V., Bonin, W. and Wyrobek, J. T. Nano/picoindentation Measurement Using A Capacitive Transducer System in Atomic Force Microscopy. Phil.
-
-
Bhushan, B.1
-
18
-
-
0030386759
-
-
Films, 1996, 290-291, 206-210.
-
Kulkarni, A. V. and Bhushan, B. Nanoscale mechanical property measurements using modified atomic force microscopy. Thin Solid Films, 1996, 290-291, 206-210.
-
V. and Bhushan, B. Nanoscale Mechanical Property Measurements Using Modified Atomic Force Microscopy. Thin Solid
-
-
Kulkarni, A.1
-
19
-
-
0030380920
-
-
Lett., 1996, 29, 221-227.
-
Kulkarni, A. V. and Bhushan, B. Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy. Mater. Lett., 1996, 29, 221-227.
-
V. and Bhushan, B. Nano/picoindentation Measurements on Single-crystal Aluminum Using Modified Atomic Force Microscopy. Mater.
-
-
Kulkarni, A.1
-
21
-
-
0028103025
-
-
Tribology, 1994, 208(J1), 17-29.
-
Bhushan, B., Koinkar, V. N. and Ruan, J. Microtribology of magnetic media. Pmc. Instn Mech. Engrs, Part J, Journal of Engineering Tribology, 1994, 208(J1), 17-29.
-
Koinkar, V. N. and Ruan, J. Microtribology of Magnetic Media. Pmc. Instn Mech. Engrs, Part J, Journal of Engineering
-
-
Bhushan, B.1
-
22
-
-
0026187096
-
-
Tribology, 1991,113,452-458.
-
Bhushan, B. and Blackman, G. S. Atomic force microscopy of magnetic rigid disks and sliders and its applications to tribology. Trans. ASME, J. Tribology, 1991,113,452-458.
-
And Blackman, G. S. Atomic Force Microscopy of Magnetic Rigid Disks and Sliders and Its Applications to Tribology. Trans. ASME, J.
-
-
Bhushan, B.1
-
23
-
-
0026938647
-
-
Tribology, 1992,114, 666-674.
-
Oden, P. I., Majumdar, A., Bhushan, B., Padmanabhan, A. and Graham, J. J. AFM imaging, roughness analysis and contact mechanics of magnetic tape and head surfaces. Trans. . ASME, J. Tribology, 1992,114, 666-674.
-
I., Majumdar, A., Bhushan, B., Padmanabhan, A. and Graham, J. J. AFM Imaging, Roughness Analysis and Contact Mechanics of Magnetic Tape and Head Surfaces. Trans. . ASME, J.
-
-
Oden, P.1
-
24
-
-
0028992233
-
-
Wear, 1995, 180, 17-34.
-
Ganti, S and Bhushan, B. Generalized fractal analysis and its applications to engineering surfaces. Wear, 1995, 180, 17-34.
-
And Bhushan, B. Generalized Fractal Analysis and Its Applications to Engineering Surfaces.
-
-
Ganti, S.1
-
25
-
-
0029409945
-
-
Wear, 1995,190, 76-88.
-
Poon, C. Y. and Bhushan, B. Comparison of surface roughness measurements by stylus profiler, AFM and non-contact optical profiler. Wear, 1995,190, 76-88.
-
Y. and Bhushan, B. Comparison of Surface Roughness Measurements by Stylus Profiler, AFM and Non-contact Optical Profiler.
-
-
Poon, C.1
-
26
-
-
0001492267
-
-
Phys., 1997, 81, 2472-2479.
-
Koinkar, V. N. and Bhushan, B. Effect of scan size and surface roughness on microscale friction measurements. J. Appl. Phys., 1997, 81, 2472-2479.
-
N. and Bhushan, B. Effect of Scan Size and Surface Roughness on Microscale Friction Measurements. J. Appl.
-
-
Koinkar, V.1
-
27
-
-
0025414841
-
-
Tribolog; 1990,112, 205-216.
-
Majumdar, A. and Bhushan, B. Role of fractal geometry in roughness characterization and contact mechanics of surfaces. Trans. ASME, J. Tribolog); 1990,112, 205-216.
-
And Bhushan, B. Role of Fractal Geometry in Roughness Characterization and Contact Mechanics of Surfaces. Trans. ASME, J.
-
-
Majumdar, A.1
-
28
-
-
84977885573
-
-
Tribology, 1991,113, 1-11.
-
Majumdar, A. and Bhushan, B. Fractal model of elastic-plastic contact between rough surfaces. Trans. ASME, J. Tribology, 1991,113, 1-11.
-
And Bhushan, B. Fractal Model of Elastic-plastic Contact between Rough Surfaces. Trans. ASME, J.
-
-
Majumdar, A.1
-
29
-
-
0026833245
-
-
Wear, 1992,153, 53-64.
-
Bhushan, B. and Majumdar, A. Elastic-plastic contact model forbifractal surfaces. Wear, 1992,153, 53-64.
-
And Majumdar, A. Elastic-plastic Contact Model Forbifractal Surfaces.
-
-
Bhushan, B.1
-
32
-
-
0343681011
-
-
Lett., 1987, 59, 1942-1945.
-
Mate, C. M., McClelland, G. M., Erlandsson, R. and Chiang, S. Atomic-scale friction of a tungsten tip on a graphite surface. Phys. Rev. Lett., 1987, 59, 1942-1945.
-
M., McClelland, G. M., Erlandsson, R. and Chiang, S. Atomic-scale Friction of A Tungsten Tip on A Graphite Surface. Phys. Rev.
-
-
Mate, C.1
-
33
-
-
0000054630
-
-
Phys., 1994, 76, 5022-5035.
-
Ruan, J. and Bhushan, B. Atomic-scale and microscale friction of graphite and diamond using friction force microscopy. J. Appl. Phys., 1994, 76, 5022-5035.
-
And Bhushan, B. Atomic-scale and Microscale Friction of Graphite and Diamond Using Friction Force Microscopy. J. Appl.
-
-
Ruan, J.1
-
34
-
-
0001383288
-
-
Phys., 1994, 76, 8117-8120.
-
Ruan, J. and Bhushan, B. Frictional behaviour of highly oriented pyrolytic graphite. J. Appl. Phys., 1994, 76, 8117-8120.
-
And Bhushan, B. Frictional Behaviour of Highly Oriented Pyrolytic Graphite. J. Appl.
-
-
Ruan, J.1
-
35
-
-
0030430312
-
-
Wear, 1996, 202, 110-122.
-
Koinkar, V. N. and Bhushan, B. Microtribological studies of Ai2C3, Al2O3-TiC, polycrystalline and single-crystal Mn-Zn ferrite and SiC head slider materials. Wear, 1996, 202, 110-122.
-
N. and Bhushan, B. Microtribological Studies of Ai2C3, Al2O3-TiC, Polycrystalline and Single-crystal Mn-Zn Ferrite and SiC Head Slider Materials.
-
-
Koinkar, V.1
-
36
-
-
0026944113
-
-
Films, 1992, 220, 132-137.
-
Meyer, E., Overney, R., Luthi, R., Brodbeck, D., Hovvald, L., Frommer, J., Guntherodt, II.-J., Wolter, O., Fujihira, M., Takano, T. and Gotoh, Y. Friction force microscopy of mixed Langmuir-Blodgett films. Thin Solid Films, 1992, 220, 132-137.
-
Overney, R., Luthi, R., Brodbeck, D., Hovvald, L., Frommer, J., Guntherodt, II.-J., Wolter, O., Fujihira, M., Takano, T. and Gotoh, Y. Friction Force Microscopy of Mixed Langmuir-Blodgett Films. Thin Solid
-
-
Meyer, E.1
-
37
-
-
0028020164
-
-
Science, 1994, 265, 2071-2074.
-
Frisbie, C. D., Rozsnyai, L. F., Noy, A., Wrighton, M. S. and Lieber, C. M. Functional group imaging by chemical force microscopy. Science, 1994, 265, 2071-2074.
-
D., Rozsnyai, L. F., Noy, A., Wrighton, M. S. and Lieber, C. M. Functional Group Imaging by Chemical Force Microscopy.
-
-
Frisbie, C.1
-
38
-
-
0030146539
-
-
Films, 1996, 278, 49-56.
-
Bhushan, B. and Kulkarni, A. V. Effect of normal load on microscale friction measurements. Thin Solid Films, 1996, 278, 49-56.
-
And Kulkarni, A. V. Effect of Normal Load on Microscale Friction Measurements. Thin Solid
-
-
Bhushan, B.1
-
39
-
-
0000659906
-
-
Phys., 1994,75,5741-5746.
-
Bhushan, B. and Koinkar, V. N. Tribological studies of silicon for magnetic recording applications. J. Appl. Phys., 1994,75,5741-5746.
-
And Koinkar, V. N. Tribological Studies of Silicon for Magnetic Recording Applications. J. Appl.
-
-
Bhushan, B.1
-
41
-
-
0039352172
-
-
Lett., 1994, 64, 1653-1655.
-
Bhushan, B. and Koinkar, V. N. Nanoindentation hardness measurements using atomic force microscopy. Appl. Phys. Lett., 1994, 64, 1653-1655.
-
And Koinkar, V. N. Nanoindentation Hardness Measurements Using Atomic Force Microscopy. Appl. Phys.
-
-
Bhushan, B.1
-
42
-
-
0031412469
-
-
Tribolog-, 1997,211(J4), 365-372.
-
Koinkar, V. N. and Bhushan, B. Microtribological properties of hard amorphous carbon protective coatings for thin film magnetic disks and heads. Proc. Instn Mech. Engrs, Part J, Journal of Engineering Tribolog)-, 1997,211(J4), 365-372.
-
N. and Bhushan, B. Microtribological Properties of Hard Amorphous Carbon Protective Coatings for Thin Film Magnetic Disks and Heads. Proc. Instn Mech. Engrs, Part J, Journal of Engineering
-
-
Koinkar, V.1
-
43
-
-
0000156345
-
-
Nanoteclmology, 1991, 2, 103-106.
-
Man-aid, P., Butt, H. J., Gould, S. A. C., Prater, C. B., Drake, B., Gurley, J. A., Clings, V. B. and Hansma, P. K. Using force modulation to image surface elasticities with the atomic force microscope. Nanoteclmology, 1991, 2, 103-106.
-
Butt, H. J., Gould, S. A. C., Prater, C. B., Drake, B., Gurley, J. A., Clings, V. B. and Hansma, P. K. Using Force Modulation to Image Surface Elasticities with the Atomic Force Microscope.
-
-
Man-aid, P.1
-
44
-
-
0027797526
-
-
Res., 1993,8,3019-3022.
-
Ruan, J. and Bhushan, B. Nanoindentation studies of fullerene films using atomic force microscopy. J. Mater. Res., 1993,8,3019-3022.
-
And Bhushan, B. Nanoindentation Studies of Fullerene Films Using Atomic Force Microscopy. J. Mater.
-
-
Ruan, J.1
-
45
-
-
0000988792
-
-
Phys., 1996, 79, 8071-8075.
-
Koinkar, V. N. and Bhushan, B. Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks. J. Appl. Phys., 1996, 79, 8071-8075.
-
N. and Bhushan, B. Micro/nanoscale Studies of Boundary Layers of Liquid Lubricants for Magnetic Disks. J. Appl.
-
-
Koinkar, V.1
-
47
-
-
33745482231
-
-
Langmuir, 1995,11,3189-3198.
-
Bhushan, B., Kulkarni, A. V., Koinkar, V. N., Boehni, M., Odoni, L., Martelct, C. and Belin, M. Microtribological characterization of self-assembled and Langmuir-Blodgett monolayers by atomic and friction force microscopy. Langmuir, 1995,11,3189-3198.
-
Kulkarni, A. V., Koinkar, V. N., Boehni, M., Odoni, L., Martelct, C. and Belin, M. Microtribological Characterization of Self-assembled and Langmuir-Blodgett Monolayers by Atomic and Friction Force Microscopy.
-
-
Bhushan, B.1
|