Adhesion maps using scanning force microscopy techniques

Journal of Adhesion

Volumn 71, Issue 4, 1999, Pages 339-356

  De Pablo, P J ^a   Colchero, J ^a   Gomez Herrero, J ^a   Baro, A M ^a   Schaefer, D M ^b   Howell, S ^c   Walsh, B ^c   Reifenberger, R ^c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b TOWSON UNIVERSITY   (United States)

^c PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; FORCE MEASUREMENT; REAL TIME SYSTEMS; SUBSTRATES; SURFACE TOPOGRAPHY;

ADHESION MAPS; ADHESIVE FORCES; NANOMETER LENGTH SCALE; SCANNING FORCE MICROSCOPY; SPATIALLY RESOLVED ADHESION;

ATOMIC FORCE MICROSCOPY;

EID: 0033314333     PISSN: 00218464     EISSN: None     Source Type: Journal    
DOI: 10.1080/00218469908014547     Document Type: Article

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