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Volumn 50, Issue 1-3, 1997, Pages 72-75

The structure of GaN layers grown on SiC and sapphire by molecular beam epitaxy

Author keywords

AlN; Convergent beam electron diffraction, CBED; Gallium nitrides, GaN; Growth mechanism; Inversion domain; Molecular beam epitaxy, MBE; Nucleation; SiC substrates; Stacking; Stacking faults; Steps; Transmission electron microscopy, TEM

Indexed keywords

CRYSTAL DEFECTS; ELECTRON CYCLOTRON RESONANCE; MOLECULAR BEAM EPITAXY; NUCLEATION; SAPPHIRE; SEMICONDUCTOR GROWTH; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0002201990     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(97)00170-0     Document Type: Article
Times cited : (14)

References (21)
  • 14
    • 0347101297 scopus 로고    scopus 로고
    • PhD dissertation, Université de Caen
    • P. Vermaut, PhD dissertation, Université de Caen, 1997.
    • (1997)
    • Vermaut, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.