Structure of the 2H-AlN/6H-SiC interface

Materials Research Society Symposium - Proceedings

Volumn 423, Issue , 1996, Pages 551-556

  Vermaut, P ^a   Ruterana, P ^a   Nouet, G ^a   Morkoc, H ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELECTRON CYCLOTRON RESONANCE; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; STACKING FAULTS; SUBSTRATES;

ALUMINUM NITRIDE; BASAL STACKING FAULTS; PRISMATIC STACKING FAULTS;

SILICON CARBIDE;

EID: 0030386550     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)