Role of surface-roughness scattering in double gate silicon-on-insulator inversion layers

Journal of Applied Physics

Volumn 89, Issue 3, 2001, Pages 1764-1770

  Gamiz F ^a   Roldan J B ^a   Cartujo Cassinello, P ^a   Lopez Villanueva J A ^a   Cartujo, P ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001744811     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1331076     Document Type: Article

References (20)

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