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Volumn 43, Issue 3 PART 2, 1996, Pages 1200-1202
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First observation of thermal runaway in the radiation damaged silicon detector
a a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
COLD STORAGE;
COMPUTER SIMULATION;
ELECTRIC FIELD EFFECTS;
FINITE ELEMENT METHOD;
LEAKAGE CURRENTS;
MICROSTRIP DEVICES;
NEUTRONS;
PARTICLE BEAMS;
PROTONS;
RADIATION DAMAGE;
THERMAL EFFECTS;
THERMODYNAMIC PROPERTIES;
BEAM INTENSITY;
FINITE ELEMENT THERMAL SIMULATION;
NEUTRON FLUENCE;
PROTON SYNCHROTRON;
RADIATION DAMAGED SILICON DETECTORS;
THERMAL RUNAWAY;
VACUUM TANK;
SILICON SENSORS;
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EID: 0030168851
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.506663 Document Type: Article |
Times cited : (18)
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References (8)
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