Pion-induced damage in silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 379, Issue 1, 1996, Pages 116-123

  Bates, S J ^a   Furetta, C ^a   Glaser, M ^a   Lemeilleur, F ^a   Leon Florian E ^a   Goßling C ^b   Kaiser, B ^b   Rolf, A ^b   Wunstorf, R ^b   Feick, H ^c   Fretwurst, E ^c   Lindstrom G ^c   Moll, M ^c   Taylor, G ^d   Chilingarov, A ^e  

^a CERN   (Switzerland)

^b TU DORTMUND UNIVERSITY   (Germany)

^c UNIVERSITY OF HAMBURG   (Germany)

^d UNIVERSITY OF MELBOURNE   (Australia)

^e BUDKER INSTITUTE OF NUCLEAR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; NEUTRONS; PROTONS; RADIATION DAMAGE; SILICON SENSORS;

CHARGE COLLECTION EFFICIENCY; PION INDUCED DAMAGE;

PARTICLE DETECTORS;

EID: 0030245010     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00538-4     Document Type: Article

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