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Journal of Non-Crystalline Solids

Volumn 266-269 A, Issue , 2000, Pages 464-468

Metastability of hot-wire amorphous-silicon thin-film transistors

(4) Stannowski, B a Brockhoff, A M a Nascetti, A b Schropp, R E I a

a UTRECHT UNIVERSITY (Netherlands)

b SAPIENZA UNIVERSITY OF ROME (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001102394 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/s0022-3093(00)00026-0 Document Type: Article

Times cited : (16)

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