THERMAL DESIGN AND BATCH FABRICATION OF CANTILEVER PROBES FOR SCANNING THERMAL MICROSCOPY

ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)

Volumn 1999-W, Issue , 1999, Pages 93-99

  Shi, Li ^a   Kwon, Ohmyoung ^a   Wu, Guanghua ^a   Majumdar, Arunava ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CHROMIUM ALLOYS; ENERGY HARVESTING; FABRICATION; HEAT TRANSFER; NANOCANTILEVERS; OPTOELECTRONIC DEVICES; SILICA; THERMOCOUPLES;

BATCH FABRICATION; CANTILEVER PROBE; DIRECT OBSERVATIONS; ELECTRONICS DEVICES; NANO-METER-SCALE; OF THERMAL PHENOMENON; SCANNING THERMAL MICROSCOPY; SPATIAL RESOLUTION; THERMAL DESIGNS; THERMAL PROBE;

PROBES;

EID: 0003055770     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE1999-0251     Document Type: Conference Paper

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