X-ray and neutron reflectivity

Zeitschrift fur Kristallographie

Volumn 213, Issue 6, 1998, Pages 319-336

  Tolan, M ^a   Press, W ^a  

^a UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000972556     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (93)

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