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Volumn 221, Issue 1-4, 1996, Pages 53-59

Thin polymer films on rough surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; MOLECULAR WEIGHT; POLYSTYRENES; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; VAN DER WAALS FORCES; VISCOELASTICITY; X RAY DIFFRACTION ANALYSIS;

EID: 0030563087     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00904-3     Document Type: Article
Times cited : (24)

References (39)
  • 17
    • 0042407309 scopus 로고
    • PhD Thesis, Kiel University
    • M. Tolan, PhD Thesis, Kiel University (1993).
    • (1993)
    • Tolan, M.1
  • 30
    • 0042908101 scopus 로고
    • Diploma Thesis, Kiel University
    • J.-P. Schlomka, Diploma Thesis, Kiel University (1994).
    • (1994)
    • Schlomka, J.-P.1
  • 32
    • 0042407289 scopus 로고
    • PhD-Thesis, State University of New York at Stony Brook
    • W. Zhao, PhD-Thesis, State University of New York at Stony Brook (1994).
    • (1994)
    • Zhao, W.1
  • 33
    • 0003293990 scopus 로고
    • Critical Phenomena at Surfaces and Interfaces (Evanescent X-Ray and Neutron Scattering)
    • Springer, Berlin
    • H. Dosch, Critical Phenomena at Surfaces and Interfaces (Evanescent X-Ray and Neutron Scattering), Springer Tracts in Modem Physics, Vol. 126 (Springer, Berlin, 1992).
    • (1992) Springer Tracts in Modem Physics , vol.126
    • Dosch, H.1
  • 37
    • 85030012974 scopus 로고    scopus 로고
    • private communication
    • M.O. Robbins, private communication.
    • Robbins, M.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.