Direct observation of subcritical fluctuations during the formation of strained semiconductor islands

Physical Review Letters

Volumn 84, Issue 2, 2000, Pages 330-333

  Jesson, D E ^a   Kastner M ^b   Voigtlander B ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000972470     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.330     Document Type: Article

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