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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 2218-2223

Investigation of the chemistry and electronic properties of metal/gallium nitride interfaces

(2) Wu, C I a Kahn, A a

a Princeton University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000884005 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.590151 Document Type: Article

Times cited : (120)

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