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Volumn 117-118, Issue , 1997, Pages 388-393

Barrier heights of GaN Schottky contacts

Author keywords

Charge neutrality level; GaN Schottky contacts; MIGS

Indexed keywords

CHARGE TRANSFER; CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; LEAD; OHMIC CONTACTS; PERMITTIVITY; SEMICONDUCTING GALLIUM COMPOUNDS; SILVER;

EID: 0031548617     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)80112-2     Document Type: Article
Times cited : (67)

References (37)
  • 8
    • 25544440844 scopus 로고
    • D.K. Ferry (Ed.), Sams, Carmel, IN
    • W. Mönch, in: D.K. Ferry (Ed.), Gallium Arsenide Technology, Vol. II, Sams, Carmel, IN, 1989, p. 139.
    • (1989) Gallium Arsenide Technology , vol.2 , pp. 139
    • Mönch, W.1
  • 34
    • 3342986527 scopus 로고
    • and papers cited therein
    • R.T. Tung, Phys. Rev. B 45 (1992) 13509, and papers cited therein.
    • (1992) Phys. Rev. B , vol.45 , pp. 13509
    • Tung, R.T.1
  • 37
    • 0006641830 scopus 로고
    • I. Ohdomari, M. Oshima, A. Hiraki (Eds.), Elsevier Science, Amsterdam
    • W. Mönch, Control of Semiconductor Interfaces, in: I. Ohdomari, M. Oshima, A. Hiraki (Eds.), Elsevier Science, Amsterdam, 1994, p. 169.
    • (1994) Control of Semiconductor Interfaces , pp. 169
    • Mönch, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.