Simulation of stress-induced leakage current in silicon dioxides: A modified trap-assisted tunneling model considering Gaussian-distributed traps and electron energy loss

Journal of Applied Physics

Volumn 89, Issue 11 I, 2001, Pages 6285-6293

  Chang, Wai Jyh ^a   Houng, Mau Phon ^a   Wang, Yeong Her ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000843960     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1367399     Document Type: Article

References (22)

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