Ultralow-temperature atomic force microscopy for the investigation of mesoscopic systems

Applied Physics Letters

Volumn 72, Issue 8, 1998, Pages 993-995

  Pelekhov, D V ^a   Becker, J B ^a   Nunes Jr , G ^a  

^a Dartmouth College   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040081428     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120618     Document Type: Article

References (26)

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