Stress distribution in thin heteroepitaxial diamond films on Ir/SrTiQ3 studied by x-ray diffraction, Raman spectroscopy, and finite element simulations

Journal of Applied Physics

Volumn 88, Issue 5, 2000, Pages 2456-2466

  Schreck, M ^a   Roll, H ^a   Michler, J ^b   Blank, E ^b   Stritzker, B ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000551225     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1287521     Document Type: Article

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