Charging effects under electron beam injection on sapphire implanted with zirconium ions

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 1997, Pages 97-100

  Berroug, A ^a   Bigarre, J ^a   Fayeulle, S ^a   Treheux, D ^a  

^a ECOLE CENTRALE DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC CHARGE MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRIC INSULATING MATERIALS; ELECTRON BEAMS; ELECTRON EMISSION; ION IMPLANTATION; SCANNING ELECTRON MICROSCOPY; ZIRCONIUM;

ELECTRON BEAM INJECTION;

SAPPHIRE;

EID: 0031333814     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)