Toward a quantitative analysis of the mirror method for characterizing insulation

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 6, Issue 2, 1999, Pages 202-210

  Coelho, R ^a   Aladenize, B ^a   Garros, B ^a   Acroute, D ^a   Mirebeau, P ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC CHARGE; ELECTRON BEAMS; ELECTROSTATICS;

ELECTROSTATIC MIRROR METHOD;

ELECTRIC INSULATING MATERIALS;

EID: 0032653959     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.765911     Document Type: Article

References (13)

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