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Applied Physics Letters

Volumn 77, Issue 11, 2000, Pages 1653-1655

Si/SiGe electron resonant tunneling diodes

(7) Paul, D J a See, P a Zozoulenko, I V b Berggren, K F b Kabius, B c Hollander B d Mantl, S d

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b LINKÖPING UNIVERSITY (Sweden)

c LEO Elektronenmikroskopie GmbH (Germany)

d FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000323725 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1309020 Document Type: Article

Times cited : (46)

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