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Brunauer, S.1
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85034546822
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note
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Sorption experiments were carried out using a Quantachrome Autosorb 1 with nitrogen as adsorbate at 77 K. The samples were degassed for 12 h at 300°C in vacuum before measurement. For each point of the isotherm 30 min were allowed to reach equilibrium.
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85034556125
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X-ray diffraction pattern were obtained using a D 8 Advance instrument (Bruker AXS) in 0/20-geometry with Cu Kα radiation and a scintillation counter (low angle region, Fig. 1a) or a position sensitive detector (high angle region, Fig. 1b).
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24
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85034535117
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ICP data were obtained with a PU 7000 of Philips-Unicom. The samples were dissolved by sodium peroxide melt-cooking. Elementary analysis data (CHN) were obtained with a Elementar VarioEl. Analytical data (in wt.-%) as follows for composite 1: Si 26.2, Ga 10.3, B 0.9, N 2.8, H 1.5, C 0.3. Data for composite 2: Si 25.9, Ga 11.2, B 0.9, N 1.9, H 1.9, C 0.2.
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25
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85034549620
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Transmission electron micrographs were obtained using a H 8100 (Hitachi) rating at 200 kV. The samples were dispersed in ethanol wit b of ultrasonics and then applied to a copper-carbon grid.
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85034558525
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71Ga NMR spectra were obtained with a Bruker ASX 400 spectrometer operating in static mode with 122 MHz resonance frequency and Hahn-echo technique.
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27
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85034537615
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Photoluminescence (PL) experimental setup: the sample was excited in the 245 nm to 255 nm (5.1 eV to 4.9 eV) spectral region by a modulated (lock-in-technique) 30 W euterium lamp combined with a band pass filter at room temperature. The resulting photoluminescence was collected by a quartz lens dispersed through a monochromator (Jobin Yvon HR-640, spectral resolution 1 nm) and registered by means of a photomultiplier (Hamamatsu R 375 P). The spectra are not corrected for the spectral sensitivity of the equipment. The spectral components were weighted by the spectral slitwidth.
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M. Smith, J. Y. Lin, H. X. Jiang, Appl. Phys. Lett. 1997, 71, 635.
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Smith, M.1
Lin, J.Y.2
Jiang, H.X.3
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85034549339
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Photoluminescence excitation spectroscopy setup: a modulated (lock-in technique) 150 W Xenon lamp combined with a double monochromator (Jobin Yvon DH 10, spectral resolution 8 nm) was used as excitation source. The luminescence was collected at room temperature by a quartz lens, filtered by a long pass filter (edge at 450 nm = 2.8 eV) to exclude any intensities coming from the excitation source and detected by means of a photomultiplier (Hamamatsu R 4220). The spectra were corrected by the spectral distribution of the excited light. The excitation spectroscopy provides information on the integral intensity of the overall luminescence (most likely caused by defects) as a function of the excitation energy. A shift of this excitation response (e.g., luminescence) to higher energies of excitation indicates a larger bandgap.
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b) G. D. Chen, M. Smith, J. Y. Lin, H. X. Jiang, Appl. Phys. Lett. 1996, 68, 2784.
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Chen, G.D.1
Smith, M.2
Lin, J.Y.3
Jiang, H.X.4
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b) H. Weller, Angew. Chem. 1993, 105, 43; Angew. Chem. Int. Ed. Engl. 1993, 32, 41.
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Weller, H.1
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b) H. Weller, Angew. Chem. 1993, 105, 43; Angew. Chem. Int. Ed. Engl. 1993, 32, 41.
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36
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85034534840
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-31 kg being the electron rest mass.
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37
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0031672757
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C. Winter, J. Käshammer, S. Mittler-Neher, R. A. Fischer, Opt. Mater. 1998, 9, 352.
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Winter, C.1
Käshammer, J.2
Mittler-Neher, S.3
Fischer, R.A.4
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