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Volumn 88, Issue 5, 2000, Pages 2278-2288

Atomistic simulation of diffuse x-ray scattering from defects in solids

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000245567     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1287525     Document Type: Article
Times cited : (28)

References (56)
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    • P. J. Partyka, R. S. Averback, K. Nordlund, I. K. Robinson, D. Walko, P. Ehrhart, T. Diaz de la Rubia, and M. Tang, in Microstructure Evolution During Irradiation, Vol. 439 of MRS Symp. Proc., edited by I. M. Robertson, G. S. Was, L. W. Hobbs, and T. Diaz de la Rubia (Materials Research Society, Pittsburgh, 1997), pp. 89-94; the same paper is also published in MRS Symp. Proc. Vol. 438, p. 77.
    • (1997) MRS Symp. Proc. , vol.439 , pp. 89-94
    • Partyka, P.J.1    Averback, R.S.2    Nordlund, K.3    Robinson, I.K.4    Walko, D.5    Ehrhart, P.6    Diaz De La Rubia, T.7    Tang, M.8
  • 15
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    • P. J. Partyka, R. S. Averback, K. Nordlund, I. K. Robinson, D. Walko, P. Ehrhart, T. Diaz de la Rubia, and M. Tang, in Microstructure Evolution During Irradiation, Vol. 439 of MRS Symp. Proc., edited by I. M. Robertson, G. S. Was, L. W. Hobbs, and T. Diaz de la Rubia (Materials Research Society, Pittsburgh, 1997), pp. 89-94; the same paper is also published in MRS Symp. Proc. Vol. 438, p. 77.
    • MRS Symp. Proc. , vol.438 , pp. 77
  • 16
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    • Defects and Diffusion in Silicon Processing, edited by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Materials Research Society, Pittsburgh)
    • K. Nordlund, P. Partyka, and R. S. Averback, in Defects and Diffusion in Silicon Processing, Vol. 469 of MRS Symposium Proceedings, edited by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Materials Research Society, Pittsburgh, 1997), pp. 199-204.
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    • Defects and Diffusion in Silicon Processing, edited by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Materials Research Society, Pittsburgh)
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    • note
    • 22| 1s experimentally known to be very small for the dumbbell structure (see Ref. 32), this comparison is relevant for our purpose. We also checked that the tetragonal deviation is small for the interstitial in our model.
  • 38
    • 0031384438 scopus 로고    scopus 로고
    • Defects and Diffusion in Silicon Processing, edited by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Materials Research Society, Pittsburgh)
    • P. Ehrhart and H. Zillgen, in Defects and Diffusion in Silicon Processing, Vol. 469 of MRS Symposium Proceedings, edited by T. Diaz de la Rubia, S. Coffa, P. A. Stolk, and C. S. Rafferty (Materials Research Society, Pittsburgh, 1997), p. 175.
    • (1997) MRS Symposium Proceedings , vol.469 , pp. 175
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    • Ph. D. Thesis, University of Illinois at Urbana-Champaign, Urbana, IL 61801
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    • (1997)
    • Partyka, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.