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Volumn 127-128, Issue , 1997, Pages 27-31

Bound vacancy interstitial pairs in irradiated silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRONS; ENERGY GAP; IONIZATION OF SOLIDS; LATTICE CONSTANTS; POINT DEFECTS; RADIATION EFFECTS; X RAY CRYSTALLOGRAPHY;

EID: 0041176250     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00851-8     Document Type: Article
Times cited : (19)

References (15)
  • 10
    • 0011831311 scopus 로고
    • eds. J.H. Crawford and L.M. Slifkin Plenum, New York
    • J. W. Corbett and J.C. Bourgoin, in: Point Defects in Solids, Vol. 2, eds. J.H. Crawford and L.M. Slifkin (Plenum, New York, 1975) p. 1.
    • (1975) Point Defects in Solids , vol.2 , pp. 1
    • Corbett, J.W.1    Bourgoin, J.C.2
  • 13
    • 30244446551 scopus 로고    scopus 로고
    • Unpublished results
    • Unpublished results.
  • 15
    • 0042401199 scopus 로고
    • eds. H.R. Huff, W. Bergholz, K. Sumino The Electrochemical Society
    • H. Bracht, N. A. Stolwijk and H. Mehrer, in: Semiconductor Silicon 1994, eds. H.R. Huff, W. Bergholz, K. Sumino (The Electrochemical Society, 1994) p. 593.
    • (1994) Semiconductor Silicon 1994 , pp. 593
    • Bracht, H.1    Stolwijk, N.A.2    Mehrer, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.