Large area X-ray detectors based on amorphous silicon technology

Thin Solid Films

Volumn 337, Issue 1-2, 1999, Pages 213-221

  Moy, Jean Pierre ^a  

^a Trixell   (France)

Author keywords

Amorphous silicon; Array; Photoconductor; Pixel; Scintillator; X ray imaging

Indexed keywords

EID: 0000023007     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01179-1     Document Type: Article

References (22)

1. R. Shaw, SPIE 2432 (1995) 2.
2. E. Samei, M.J. Flynn, SPIE 3032 (1997) 328.
3. I.A. Cunningham, M.S. Westmore, A. Fenster, Med. Phys. 21 (3) (1994) 417.
4. P. Moy, SPIE 3336 (1998) 187.
5. R.S. Swank, Appl. Opt. 12 (8) (1973) 1865.
6. J.A. Rowlands, S. Kasap, Phys. Today (1997) 24.
7. R. Sudharsanan, N.H. Karam, W.D. Halverson, A.C. Greenwald, M. Dixit, J. Dubeau, E. Sommerville, IEEE Trans. Nucl. Sci. 44 (3) (1997) 98.
8. M. Schieber et al., 5th Conference on Advanced Technology and Particle Physics Oct. 1996, p. 711.
9. R. Street, R. Apte, S. Ready, K. Shah, P. Bennet, M. Klugerman, Y. Dmitriyev, SPIE 3336 (1998) 24.
10. R.L. Weisfield, M.A. Hartney, R.A. Street, R. Apte, SPIE 3336 (1998) 444.
11. N.C. Bird, C.J. Curling, C. van Berkel, Sensors Actuators A 46 (1995) 444.
12. D.L. Lee, et al., SPIE 3032 (1997) 88.
13. J.A. Rowlands, et al., SPIE 3032 (1997) 98.
14. J.M. Boudry, L.E. Antonuk, Med. Phys. 23 (5) (1996) 743.
15. J. Chabbal, C. Chaussat, T. Ducourant, et al., Spie 2708 (1996) 499.
16. T. Graeve, Y. Li, A. Fabans, W. Huang, SPIE 2708 (1996) 494.
17. R.E. Colbeth, M.J. Allen, D.J. Day, et al., SPIE 3336 (1998) 376.
18. N. Jung, F. Busse, N. Conrads, et al., SPIE 3336 (1998) 396.
19. C. Chaussat, J. Chabbal, T. Ducourant, V. Spinnler, G. Vieux, R. Neyret, SPIE 3336 (1998) 45.
20. T. Kameshima, N. Kaifu, E. Takami, M. Morishita, T. Yamazaki, SPIE 3336 (1998) 453.
21. A. Tsukamoto, S. Yamada, T. Tomisaki, M. Tanaka, T. Sakaguchi, H. Asahina, M. Nishiki, SPIE 3336 (1998) 388.
22. G. Shaber, D.L. Lee, J. Bell, G. Powell, A.D. Maidment, SPIE 3336 (1998) 463.