Radiographic imaging characteristics of a direct conversion detector using selenium and thin film transistor array

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3032, Issue , 1997, Pages 88-96

  Lee, Denny L Y ^a   Cheung, Lawrence K ^a   Jeromin, Lothar S ^a   Palecki, Eugene F ^a   Rodricks, Brian G ^a  

^a Sterling Diagnostic Imaging Inc   (United States)

Author keywords

Digital; Electronic; Medical imaging; Radiography; Selenium; Thin film transistor array; X rays

Indexed keywords

AMORPHOUS SILICON; DETECTORS; ELECTRIC FIELDS; ELECTRIC SIGNAL SYSTEMS; IMAGE ANALYSIS; MICROMETERS; MODULATION; NONMETALS; PIXELS; RADIOGRAPHY; RADIOLOGY; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SENSORS; THICKNESS MEASUREMENT; THIN FILM DEVICES; THIN FILM TRANSISTORS; TRANSISTORS; X RAY RADIOGRAPHY;

ACTIVE IMAGING; DETECTOR QUANTUM EFFICIENCY (DQE); DIGITAL; ELECTRONIC; FILL FACTOR (FF); LATERAL SPREADING; MODULATION TRANSFER FUNCTION (MTF); NOISE ANALYSIS; PHOTON COUNTING; PROTOTYPE DEVICES; RADIOGRAPHIC IMAGING; SILICON THIN FILMS; SPATIAL RESOLUTION (SR); STORAGE CAPACITORS; TEST OBJECT (TO); THIN-FILM-TRANSISTOR ARRAY; X-RAYS;

MEDICAL IMAGING;

EID: 0343132877     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.273973     Document Type: Conference Paper

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