New CsI / a-Si 17″ × 17″ X-ray flat panel detector provides superior detectivity and immediate direct digital output for general radiography systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3336, Issue , 1998, Pages 45-56

  Chaussat, Christophe ^a   Chabbal, Jean ^a   Ducourant, Thierry ^a   Spinnler, Vincent ^a   Vieux, Gérard ^a   Neyret, Robert ^a  

^a Trixell   (France)

Author keywords

Amorphous Silicon; Cesium Iodide; Digital Radiography; DQE; Photoconductor; Photodiode; Scintillator; Selenium; X ray

Indexed keywords

AMORPHOUS SILICON; CESIUM COMPOUNDS; PHOSPHORS; PHOTOCONDUCTING MATERIALS; PHOTODIODES; RADIOGRAPHY; SELENIUM; X RAYS;

DIGITAL RADIOGRAPHY;

IMAGING SYSTEMS;

EID: 0032401637     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317049     Document Type: Conference Paper

References (8)

1. Amorphous silicon X-ray image sensor
2. Image quality of scintillator based x-ray electronic imagers
3. Flat panel X-ray detector using amorphous silicon technology: Reduced radiation dose for the detection of foreign bodies
4. Radiographic imaging charcteristics of a direct conversion detector using selenium and thin film transistor array