Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties

Superlattices and Microstructures

Volumn 36, Issue 4-6, 2004, Pages 573-580

  Darakchieva, V ^a   Paskov, P P ^a   Valcheva, E ^a   Paskova, T ^a   Schubert, M ^b   Bundesmann, C ^b   Lu, H ^c   Schaff, W J ^c   Monemar, B ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CORRELATION METHODS; ELLIPSOMETRY; FILM GROWTH; INFRARED SPECTROSCOPY; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; PHONONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; STRAIN; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC RESPONSES; FREE-CARRIER PLASMON EXCITATIONS; INFRARED ELLIPSOMETRY; IR SPECTROSCOPIC ELLIPSOMETRY (IRSE); STRAIN-FREE FREQUENCIES;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 9944244475     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2004.09.014     Document Type: Article

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