Thick crack-free AlGaN films deposited by facet-controlled epitaxial lateral overgrowth

Physica Status Solidi C: Conferences

Volumn , Issue 7, 2003, Pages 2136-2140

  Liu, R ^a   Bell, A ^a   Ponce, F A ^a   Amano, H ^b   Akasaki, I ^b   Cherns, D ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b MEIJO UNIVERSITY   (Japan)

^c UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN LAYERS; FACET-CONTROLLED EPITAXIAL LATERAL OVERGROWTHS; GROWTH FRONT; GROWTH PARAMETERS; LATERAL OVERGROWTH; LOW TEMPERATURES; MONOCHROMATIC CATHODOLUMINESCENCE; OPTICAL CHARACTERIZATION;

CATHODOLUMINESCENCE; CRACKS; GALLIUM NITRIDE; LATTICE MISMATCH; LIGHT EMITTING DIODES; TRANSMISSION ELECTRON MICROSCOPY;

EPITAXIAL GROWTH;

EID: 9744266301     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303450     Document Type: Conference Paper

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