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Volumn 237-239, Issue 1 4 II, 2002, Pages 1065-1069

Reduction of threading dislocation density in AlXGa1-XN grown on periodically grooved substrates

Author keywords

A1. Transmission electron microscopy; A3. Metalorganic vapor phase epitaxy; B1. Nitrides

Indexed keywords

DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; LOW TEMPERATURE EFFECTS; MASKS; OPTOELECTRONIC DEVICES; SEMICONDUCTING ALUMINUM COMPOUNDS; SINGLE CRYSTALS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036530429     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)02128-5     Document Type: Article
Times cited : (13)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.