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Volumn 237-239, Issue 1 4 II, 2002, Pages 1065-1069
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Reduction of threading dislocation density in AlXGa1-XN grown on periodically grooved substrates
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Author keywords
A1. Transmission electron microscopy; A3. Metalorganic vapor phase epitaxy; B1. Nitrides
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Indexed keywords
DISLOCATIONS (CRYSTALS);
GALLIUM NITRIDE;
LOW TEMPERATURE EFFECTS;
MASKS;
OPTOELECTRONIC DEVICES;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SINGLE CRYSTALS;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
HETEOREPITAXIAL LATERAL OVERGROWTH TECHNIQUES;
THREADING DISLOCATIONS;
METALLORGANIC VAPOR PHASE EPITAXY;
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EID: 0036530429
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)02128-5 Document Type: Article |
Times cited : (13)
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References (15)
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