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Volumn 16, Issue 20, 2004, Pages 1857-1860

Tubes with controllable internal nanotopography

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COALESCENCE; CONCENTRATION (PROCESS); ELECTRON BEAM LITHOGRAPHY; FAST FOURIER TRANSFORMS; PARAMETER ESTIMATION; PHOTOPOLYMERIZATION; SURFACE TOPOGRAPHY;

EID: 9644257119     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200400408     Document Type: Article
Times cited : (35)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.