Data remanence in semiconductor devices

Proceedings of the 10th USENIX Security Symposium

Volumn , Issue , 2001, Pages

  Gutmann, Peter ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC STORAGE; RANDOM ACCESS STORAGE; REMANENCE; SEMICONDUCTOR STORAGE; SIDE CHANNEL ATTACK;

DATA REMANENCE; HOT CARRIER EFFECT; MAGNETIC STORAGE MEDIA; MEMORY CELL; NON-VOLATILE MEMORY; SEMICONDUCTOR MEMORY; TECHNICAL BACKGROUND;

SEMICONDUCTOR DEVICES;

EID: 85084163443     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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