A novel approach for testing and improving the static accuracy of high performance digital-to-analog converters

Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003

Volumn , Issue , 2003, Pages

  Macii, D ^a  

^a UNIVERSITY OF PERUGIA   (Italy)

Author keywords

DAC; FPGA; Integral Non Linearity (INL)

Indexed keywords

DIGITAL TO ANALOG CONVERSION; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); SYSTEMS ANALYSIS;

BUILT-IN SELF-TEST ARCHITECTURES; COMPLEXITY ISSUES; DIGITAL SELF-CALIBRATION; EFFICIENCY IMPROVEMENT; HIGH-LEVEL MODELING; INTEGRAL NONLINEARITY; NOVEL STRATEGIES; STRUCTURAL FEATURE;

BUILT-IN SELF TEST;

EID: 85084023088     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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