Static nonlinearity testing of digital-to-analog converters

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 5, 2001, Pages 1283-1288

  Vargha, Balázs ^b   Schoukens, Johan ^a,c   Rolain, Yves ^a,c  

^a IEEE   (Belgium)

^b BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^c VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Bit intermodulation; Digital to analog converter (DAC); Testing data converters; Walsh transformation

Indexed keywords

BIT INTERMODULATION; STATIC NONLINEARITY TESTING; TESTING DATA CONVERTERS; WALSH TRANSFORMATIONS;

BIT ERROR RATE; COMPUTER SIMULATION; ERROR ANALYSIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; INTERMODULATION; MATHEMATICAL TRANSFORMATIONS; SPURIOUS SIGNAL NOISE;

DIGITAL TO ANALOG CONVERSION;

EID: 0035483575     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.963198     Document Type: Article

References (5)

1. Dynamic testing and diagnostics of A/D converters
2. Modeling the noise influence on the Fourier coefficients after a discrete Fourier transform