Accurate statistical yield model for CMOS current-steering D/A converters

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 2000, Pages

  Van den Bosch, A ^a   Steyaert, M ^a   Sansen, W ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MODELS; TRANSISTORS;

CURRENT SOURCE TRANSISTORS; CURRENT STEERING CONVERTERS;

DIGITAL TO ANALOG CONVERSION;

EID: 0033699219     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2000.858699     Document Type: Conference Paper

References (5)