Optimal method for testing digital to analog converters

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 1997, Pages 42-46

  Fasang, Patrick P ^a  

^a HITACHI AMERICA LTD   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SOFTWARE; ERROR ANALYSIS; INTEGRATED CIRCUIT TESTING; SWITCHING THEORY;

DIFFERENTIAL LINEARITY;

DIGITAL TO ANALOG CONVERSION;

EID: 0030720148     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)