Using reduced-order models in D/A converter testing

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2002, Pages 701-706

  Vargha, Balázs ^a   Schoukens, Johan ^b   Rolain, Yves ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Digital to analog conversion; Mixed signal modeling; Nonlinearity diagrams; Testing data converters

Indexed keywords

DIGITAL TO ANALOG CONVERSION; ELECTRIC CONVERTERS; ELECTRIC NETWORK PARAMETERS; ERROR ANALYSIS; MATHEMATICAL MODELS;

DEVICE ERROR RESPONSE; DIGITAL TO ANALOG CONVERTER TESTING; MIXED SIGNAL MODELING; REDUCED ORDER MODELS; TESTING DATA CONVERTERS;

NONLINEAR NETWORK ANALYSIS;

EID: 0036045511     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/IMTC.2002.1006927     Document Type: Article

References (6)

1. Developing linear error models for analog devices
2. Modeling and test point selection for data converter testing
3. Linear error modeling of analog and mixed-signal devices
4. A rigorous exposition of the LEMMA method for analog and mixed-signal testing
5. Static non-linearity testing of digital-to-analog converters